提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
采用三维时间域有限差分（FDTD）方法研究了扫描近场光学显微镜中光纤微探针的近场分布特性。
The near field distribution of uncoated and metal coated fiber optic probes were characterized by the method of three dimensional finite difference time domain (FDTD).
测量中，把扫描隧道显微镜的探针扫描线作为参考栅，把物质原子晶格栅结构作为试件栅，对这两组栅线干涉形成的云纹进行了纳米级变形测量。
In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating.
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
三维压电陶瓷扫描器是扫描探针显微镜的关键部件。
The piezoelectric scanner is one of the key components of scanning probe microscope.
选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜(SPM)和电化学测试系统进行一般性的表征。
A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope (SPM) and an electrochemical measurement system.
探讨了外界激振对扫描探针显微镜(SPM)扫描图像的影响。
The influence of external vibration on scanned images of scanning probe microscope (SPM) is discussed.
探针是所有扫描探针显微镜的关键部件。
Probe is a crucial part of all the scanning probe microscopes.
扫描探针显微镜(SPM)当前的发展趋势是功能复合化和数字化。
A general trend of Scanning Probe Microscope (SPM) is to multiple functionality and digitalization.
针对法兰盘加工面上出现的黑纹缺陷，采用光学显微镜、扫描电镜和电子探针等测试方法对其进行了分析。
Analysis is made on the dark lines defects occurring over the working surface of flange by measurement with the optical microscope, Scanning electro microscope (SEM) and electronic probe.
单管式扫描器的结构误差是影响扫描探针显微镜测量精度的主要误差因素之一。
Tube scanner′s structure errors have great effect on the measurement accuracy of Scanning Probe Microscope(SPM).
扫描探针显微镜是近十几年来在表面特征、表面形貌观测方面最重大的进展之一，是纳米测量学的基本工具。
The scanning probe microscope is one of the most important developments on observing and determining surface topography and surface properties in near ten years and is basic tool of nano-measurement.
利用光学显微镜、扫描电子显微镜和电子探针研究了不同保温时间对钢液中非金属夹杂物的形状、成分和尺寸的影响。
The effects of different holding times on the shapes, compositions and sizes of the inclusions were investigated by using optical and scanning electron microscopes and by the electron microprobe.
电化学扫描探针显微镜(ECSPM)已成为研究固-液界面结构的有力的工具。
Electrochemical scanning probe microscopes (ECSPM) have become one of the most powerful techniques for studies of solid liquid interfaces.
钨探针是扫描隧道显微镜（STM）常用探针之一。
Tungsten probe is one of the common probes used in scanning tunnel microscopy (STM).
本文将介绍扫描探针显微镜及其在微电子工艺和器件微分析中的应用。
This paper gives an overview of SPM technology and its applications in microanalysis of microelectronics process and devices.
利用扫描探针显微镜(SPM)能够实现纳米级电子器件和机械器件的加工。
Nanofabrication in electrical field by Scanning Probe Microscope (SPM) can fabricate electrical devices and mechanical structures in nanometer scale.
目前，我国引进的一般商业性的SPM(扫描探针显微镜)中缺少误差的自动修正和改进系统。
Up to now the imported commercial scanning probe microscope (SPM) has not an automatic error correcting and reducing system.
通过使用原子吸收光谱仪，扫描显微镜和能量色散X射线谱仪对覆膜光纤探针进行表征。
Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.
光子扫描隧道显微镜(PSTM)是一种高分辨率的扫描探针式显微镜。
Photon scanning Tunneling microscopy (PSTM) is a kind of scanning probe microscopy with high resolution.
针对扫描探针显微镜中扫描图像显示的大小与实际大小存在较大误差，提出了基于图像处理和人工神经网络标定的方法。
Aiming at big discrepancy between SPM scan image display size and it's actual size, an automatic calibration method based on digital image processing and artificial neural network was proposed.
对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。
Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
压电工作台属典型的压电元件驱动的微定位器，在扫描探针显微镜等仪器设备中应用较广。
Piezoelectrically driven micropositioning stage (piezo-stage) is one of the typical piezoelectrically driven actuator which is widely used in scanning probe microscopy.
扫描离子电导显微镜技术是在纳米尺度进行非导电的生物样品成像的一种新型扫描探针显微镜技术。
As a new kind of scanning probe microscopy, scanning ion conductance microscopy (SICM) is designed for imaging non-conducting biological sample at the nanometer scale.
近场光显微镜(NFOM)是一种高分辩率的扫描探针显微镜。
Near Field Optical Microscope (NFOM) is a kind of scanning probe microscopy with high resolution.
扩散偶和合金样品采用光学显微镜、扫描电镜和电子探针显微分析技术进行分析。
Both the diffusion couple specimens and the alloys were examined by means of optical microscopy, scanning electron microscopy, and electron probe microanalysis.
从矿用锚喷机分料盘的实际工作条件出发，利用扫描电子显微镜和电子探针观察分析分料盘的磨损机理。
According to the actually operation condition of the lining plate of concrete shotting machine, the wear mechanism of the lining plate has been analyzed with SEM.
利用该方法研制的成品弯曲光纤探针应用于光子扫描隧道显微镜系统，得到了比较理想的样品图像。
The bend optical fiber probe is used in developed NSOM system and the perfect images are obtained.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
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