本文就纳米尺度铁电畴的扫描力显微镜的成像原理的研究进展作一综述。
This review is involved with the latest progress in the imaging principle of nanoscale ferroelectric domain via SFM.
本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
拍摄这个尘埃的设备称为原子力显微镜，通过用弹簧末端上的一个细尖扫描尘埃来绘制这个颗粒的三维形状。
The device that imaged the dust speck is called an atomic force microscope, which maps the shape of particles in three dimensions by scanning them with a sharp tip at the end of a spring.
这种原子力显微镜能够扫描象100纳米一样小的颗粒的形状。
The atomic force microscope can detail the shapes of particles as small as about 100 nanometers.
原子力显微镜扫描对醛基化玻片表面形貌进行分析。
Scanning aldehyde group glass slide by atomic force microscopy study the surface shape.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
介绍了扫描隧道显微镜(STM)和原子力显微镜(afm)的原理和目前情况。
This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
设计方案对扫描器的负载能力要求不高，而且能使原子力显微镜实现较大范围的针尖扫描。
This design not only can realize large range scanning of AFM, but also does not request the high load ability of the scanner.
并用扫描电子显微镜(sem)、透射电子显微镜(TEM)和原子力显微镜(afm)对阳极氧化铝膜的形貌和结构进行了表征。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). Transmission electron microscopy (TEM) and atom force microscopy (AFM).
本文针对原子力显微镜系统，提出了一种基于学习控制的快速扫描模式。
This paper proposes a learning control based high-speed scanning mode for an AFM system.
下面将从头部开始，穿过胸腔，一直到达腹腔，经过这次自我发现之旅，让你切身体验到扫描电子显微镜的非凡影响力。
Here you'll experience the power of SEM in a journey of self-discovery that starts in your head, travels down through the chest and ends in the bowels of the abdomen.
利用原子力显微镜(afm)、扫描电镜(sem)和光学显微镜观察分析了硫化亚铁喷涂层的表面、截面与磨面形貌。
AFM, SEM equipped with EDX and optical microscope were employed to observe and analyze the morphologies of the surface, cross-section and wear scar of the coatings.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
用原子力显微镜、扫描电子显微镜研究了复合材料的微观结构，并测试了力学性能。
AFM and SEM were used to study the microstructure of composites, and the mechanical properties were tested.
利用原子力显微镜和扫描电镜观察了材料的烧蚀形貌，测量了破坏阈值与脉冲宽度、烧蚀深度与脉冲能量的依赖关系。
The damage morphology, and threshold fluence as a function of pulse duration and the dependence of ablation depths on the pulse fluences are measured.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
并采用扫描电子显微镜（SEM）及原子力显微镜（AFM）对AAO模板表面及内部结构进行了表征。
Scanning electron microscope (SEM) and atom force microscope (AFM) were used to characterize the morphologies of the AAO template, respectively.
提出了一种用于针尖扫描原子力显微镜(afm)的光点跟踪设计方案，结构简单，容易实现。
A design of optical tracking that can be applied to scanned-cantilever atomic force microscope (AFM) is proposed. The configuration of the design is very simple and can be actualized easily.
运用差示扫描量热分析、动态力学分析、交流复阻抗谱、扫描电镜和原子力显微镜对体系性能和形态进行了研究。
DSC, DMA, complex impedance analysis, SEM, and AFM were used to investigate the properties and morphology of the system.
在扫描探针纳米加工技术的基础上，提出了利用原子力显微镜（AFM）来制作高频光栅的新工艺。
On the basis of micro-fabrication technique using the atomic force microscope, a new method was proposed for producing high frequency grating.
通过沉降时间观察其分散性，采用激光粒度仪、扫描电镜、原子力显微镜对分散效果进行进一步分析。
Then the dispersity was evaluated with settlement time. And laser particle size analyzer, SEM and AFM were employed to confirm the results.
采用力调制原子力显微镜及扫描电镜的线扫描功能对复合材料界面相精细结构进行分析。
Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.
采用扫描电镜（ S E M ）和原子力显微镜（ A F M ）分别对膜的断面、表面形态作了研究。
The cross section and surface image of NF 1 composite membrane were studied by SEM and AFM respectively.
通过电子扫描电镜、原子力显微镜观察复合膜材料表皮层、多孔支撑层及断面结构。
The asymmetric membrane structure was observed which was composed of surface layer and porous support layer. And composite membrane had more loosen finger-like pore structure.
用原子力扫描显微镜对两种薄膜观测发现，高聚物— 金属界面比高聚物—玻璃界面薄膜要平整、均匀的多，玻璃衬底上形成的高聚物界面高分子有明显的取向结构；
Observation finds that the interface of high polymer-metal is much smoother and more homogeneous. Also, the M-line on polymer-metal interface is clearer than on polymer-glass interface.
用原子力扫描显微镜对两种薄膜观测发现，高聚物— 金属界面比高聚物—玻璃界面薄膜要平整、均匀的多，玻璃衬底上形成的高聚物界面高分子有明显的取向结构；
Observation finds that the interface of high polymer-metal is much smoother and more homogeneous. Also, the M-line on polymer-metal interface is clearer than on polymer-glass interface.
应用推荐