本文中应用了偏光显微镜、扫描电子显微镜和X射线衍射仪分别对试样的组构特征及扁平颗粒的定向排列特征作了观察和测定。
Polarization microscope, scan electronmicroscope and X ray diffractometer are applied separately to view and determine the fabric characteristics and orientated range of flat particles in samples.
本文中应用了偏光显微镜、扫描电子显微镜和X射线衍射仪分别对试样的组构特征及扁平颗粒的定向排列特征作了观察和测定。
Polarization microscope, scan electronmicroscope and X ray diffractometer are applied separately to view and determine the fabric characteristics and orientated range of flat particles in samples.
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