本文介绍了一种新颖的集成电路分档成品率的优化模型及求解。
A novel optimal model and its solving to the layer yield of IC's is presented.
以某型铝合金车轮的模具设计为例，证明了该模拟方法能够指导模具结构优化，减少反复修模、试模所造成的能源浪费，提高工艺成品率。
This simulation method can conduct die structure optimization, and reduce repeat die repair and waste of die trial energy, and improve rate of finished product.
研究了基于微电子测试的双桥结构图形，功能成品率模型参数提取的优化方法。
Then, based on the double bridge test structure, an optimization method is presented which is used to extracting the parameters of yield model fast and effectively.
同时采用基于EDA软件的仿真优化方法，对其进行了仿真优化设计，得出其在最优性能及较高的成品率下的各器件参数值。
It is simulated and optimized based on the method of EDA software. The parameter of different devices is calculated with optimum performance and higher yield.
结果优化制粒的工艺条件，确定一步制粒的最佳工艺参数，从而提高颗粒的成品率。
RESULTS Obtained the optimization of one-step pelletization technology and the technical parameters, to improve the ratio of finished product.
超大规模集成电路(VLSI)中的参数成品率最优化问题一直是集成电路可制造性设计的重点研究问题。
The maximum problem of parametric yield in VLSI is always an important issue in design for manufacturing (DFM).
这对计算VL SI关键面积、指导版图优化设计和提高IC成品率有重要意义。
It is important to the calculation of VLSI critical area and the optimization of IC layout design.
这对计算VL SI关键面积、指导版图优化设计和提高IC成品率有重要意义。
It is important to the calculation of VLSI critical area and the optimization of IC layout design.
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