本文主要介绍了扫描质子探针中微束核反应分析原理。
The principles and analytical technique of nuclear analysis of scanning microprobe (micro NRA) was introduced.
方法应用电子探针微区分析(EPMA)技术对初期釉质龋中化学成分的空间分布进行选定微区、线扫描及面扫描分析。
Methods the spatial distribution of the compositional elements in incipient enamel caries was obtained by spot selection, line and map analyses with electron probe microanalysis technique (EPMA).
扫描核探针技术作为一种新的微区痕量元素分析及元素微区分布分析手段越来越引人注目。
As a new tool for trace-element analysis and elemental spatial distribution analysis in microarea, scanning proton microprobe (SPM) is becoming more noticeable.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
压电工作台属典型的压电元件驱动的微定位器，在扫描探针显微镜等仪器设备中应用较广。
Piezoelectrically driven micropositioning stage (piezo-stage) is one of the typical piezoelectrically driven actuator which is widely used in scanning probe microscopy.
配备X射线能谱仪的扫描电镜和电子探针已广泛的应用于分析领域，是最为主要的微区成分分析的工具。
Energy Dispersive Spectrometer (EDS) has been widely applied to analytical field with electron probe and scanning electron microscopy, and it is the main tool of element analysis.
目前在扫描力显微镜中经常用到的氮化硅三角形探针本身可以作为一个基于点微射干涉的微干涉元件。
A new optical interferometer suitable for using in the scanning force microscope is presented. The cantilever itself is used as a micro interferometer element.
目前在扫描力显微镜中经常用到的氮化硅三角形探针本身可以作为一个基于点微射干涉的微干涉元件。
A new optical interferometer suitable for using in the scanning force microscope is presented. The cantilever itself is used as a micro interferometer element.
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