介绍了随钻测量仪测试系统中，基于MC68 HC 908gz60微处理器的数据采集控制器设计。
Introduced is the design of data acquisition controller based on MC68HC908GZ60 microprocessor in MWD testing system.
本文提出一种新的，用户环境下微处理器alu功能的测试方法。
In this paper, a new method is presented for functional testing of microprocessor ALU in user environment.
针对微处理器系统测试问题，提出了一种全新的功能测试方法。
We propose a new approach of functional testing for microprocessor systems and discuss the hardware associated and test generation.
在测试过程中应用微处理器，加快了计算速度。
In the measurement process, a microprocessor was used to speed up the calculation processes.
提出了一种基于片上微处理器和透明路径测试访问的SO C自测试方案。
A microprocessor based builtin test scheme for SOC is proposed, which employs transparency path test access mechanism.
本研究以单晶片8052微处理器制成控制器，并对系统作完整的测试评估。
This research is made into the controller with single chip 8052 microprocessors and tested.
该系统充分发挥了S3C44B0嵌入式微处理器高性能优势，经调试证明，能够可靠地实现对半导体分立器件的参数测试和分选的功能。
The semiconductor testing system makes full use of the high-powered ARM microprocessor S3C44B0. It is testified that the system can meet the requirement of function.
本文基于可复用设计方法学，对用途广泛的微处理器80c51IP软核的测试方法和应用技术进行研究。
According to the design reuse methodology, this dissertation focus on the research of widely used 80c51 IP soft core, including the test and application technology.
本文针对微处理器的特点，提出了指令级全速电流测试方法。
In this paper we have proposed instruction level At-speed current testing method taking both the characteristics of microprocessor and At-speed current testing into account.
因为仿真器的工作完全仿照微处理器，你可以用微处理器的装配语言或可以在微处理器上运行的语言来编写测试程序。
Because the emulator works exactly like the microprocessor, you write test programs in the assembly language of the microprocessor or in a language that can be compiled to run on the microprocessor.
通过理论计算和代价分析，在消耗资源不多的情况下，当微处理器发生故障时其可测试率达到了99%以上。
Through theoretical calculations and the cost analysis, with few consumption of resources, the rate can be tested to reach 99% when a fault is in its microprocessor.
为了验证该方法的有效性，本文针对一块以MC 6800为微处理器的电路板进行了测试程序开发。
To verify the approach, we generate the test program for a circuit board based on MC6800 microprocessor.
在各模块相应的测试方法基础上，采用逐步扩展测试范围的编排原则，编制整个微处理器功能测试程序。
On the basis of corresponding test methods of each module, the whole functional test program is programed by using th…
在各模块相应的测试方法基础上，采用逐步扩展测试范围的编排原则，编制整个微处理器功能测试程序。
On the basis of corresponding test methods of each module, the whole functional test program is programed by using th…
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