在各模块相应的测试方法基础上，采用逐步扩展测试范围的编排原则，编制整个微处理器功能测试程序。
On the basis of corresponding test methods of each module, the whole functional test program is programed by using th…
本文提出一种新的，用户环境下微处理器alu功能的测试方法。
In this paper, a new method is presented for functional testing of microprocessor ALU in user environment.
针对微处理器系统测试问题，提出了一种全新的功能测试方法。
We propose a new approach of functional testing for microprocessor systems and discuss the hardware associated and test generation.
该系统充分发挥了S3C44B0嵌入式微处理器高性能优势，经调试证明，能够可靠地实现对半导体分立器件的参数测试和分选的功能。
The semiconductor testing system makes full use of the high-powered ARM microprocessor S3C44B0. It is testified that the system can meet the requirement of function.
该系统充分发挥了S3C44B0嵌入式微处理器高性能优势，经调试证明，能够可靠地实现对半导体分立器件的参数测试和分选的功能。
The semiconductor testing system makes full use of the high-powered ARM microprocessor S3C44B0. It is testified that the system can meet the requirement of function.
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