然而，随着测量分辨力的提高，则需要更多的延迟组件和附加电路，这样不但设备的复杂度增加，而且还会产生附加误差，测量分辨力受到限制。
However, to obtain a higher resolution much more delay components and additional circuits must be used and with this way the additional errors will be generated and measuring resolution is limited.
然而，随着测量分辨力的提高，则需要更多的延迟组件和附加电路，这样不但设备的复杂度增加，而且还会产生附加误差，测量分辨力受到限制。
However, to obtain a higher resolution much more delay components and additional circuits must be used and with this way the additional errors will be generated and measuring resolution is limited.
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