研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
利用X-射线衍射分析和电子显微镜分析的结果，确定堇青石窑具的多晶结构和各晶相的含量；
The Polycrystalline structure and the phase composition of cordierite kiln furniture are deter-mined by means of X-ray and electron microscope.
其中还涉及X射线衍射、电子显微镜及其他仪器的使用，以检测材料的分子结构。
The program includes use of X-ray diffraction, electron microscopy, and other techniques for testing materials on the molecular level.
利用红外、X射线衍射、差热和电子显微镜等手段研究了复合锂钙基脂的结构。
The structure of Li Ca complex grease was studied through IR spectroscopy, X ray diffraction, DTA and electron microscope.
射线衍射和透射电子显微镜实验不但证实它的非晶性，而且给出它的平均颗粒度大小和晶化产物。
X-ray diffraction and transmission electron microscope experiments indicate the powder sample is amorphous and also show the average particle size and crystallization products.
利用显微硬度计、金相显微镜和X射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。
The hardness gradient, depth, microstructure and phases of nitrided layers were measured with Microhardness Apparatus, Microcopy and X-ray diffractometer.
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
采用X射线衍射和扫描电子显微镜测定了碳化硼粉的粒度和点阵数。
The grain size and lattice constant of Boron carbide was determined by method of X ray diffraction and scanning electron microscope (SEM).
应用X射线衍射和扫描电子显微镜研究了溶剂诱导结晶PET的形态和结晶结构。
The morphology and crystal structure of solvent induced crystalline PET were studied by X-ray diffraction and scanning electron microscope.
本文提出了采用偏光显微镜和X射线衍射仪联合方法鉴定自行车闸皮中低含量的温石棉、铁石棉及青石棉等三种石棉的方法。
A method of identification for low content chrysotile, crocidolite and amosite in brake rubber of bicycle by the united way of polarized light microscope and X-ray diffraction had been established.
利用扫描电子显微镜（SEM ）、显微喇曼光谱、X射线衍射等手段对合成的金刚石薄膜的成分与结构进行了分析。
The constituents and the structures of the diamond films have been identified by means of scanning electron microscopy (SEM), Raman spectroscopy and X-ray diffraction.
利用光学显微镜、扫描电镜和X射线衍射仪研究了几种不同状态硅砖的晶体形貌和晶格常数。
The crystalline morphology and lattice constants of silica bricks in several status were investigated by the optic microscope, scanning electron microscope and X-ray diffraction.
用扫描电子显微镜和X射线衍射技术分析了微晶玻璃析晶和显微特征。
The crystallization and microstructure of the glass were investigated using scanning electron microscopy and X-ray diffraction technique.
并且借助于偏光显微镜、广角X-射线衍射仪（WAXD）和差式扫描量热仪（DSC）研究了不同成膜条件下膜的结晶情况。
And polarizing microscope, wide-angle X-ray diffraction (WAXD) and differential scanning calorimeter (DSC) were used to study the crystalline of PLA membranes prepared at different conditions.
采用X射线衍射（XRD）、透射电子显微镜（TEM）分析手段对样品的物相、结构、形貌进行了表征和分析。
The sample's crystal phase, structure, morphology and the reaction process were characterized and analyzed by using X-ray diffraction(XRD), transmission electron microscopy(TEM).
利用原子力显微镜、能量散射X射线谱、X射线衍射和交变梯度磁强计研究了该颗粒膜材料的结构和磁学性质。
The structural and magnetic properties of the granular film are studied by atomic force microscope, energy dispersion X-ray spectrum, X-ray diffraction, and alternating gradient magnetometer.
用X射线衍射（XRD）、透射电子显微镜（TEM）等技术研究了PAN基碳纤维在单电流脉冲作用下的结构变化。
The structural change of PAN based carbon fibre by an electric current pulse was studied by means of X-ray diffraction(XRD) and transmission electron microscopy(TEM).
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
用DTA、IR、MS、X射线衍射和偏光显微镜初步研究了共聚物的结构，证明所得产物主要是嵌段共聚物。
The structure of the copolymer was identified by DTA, IR, MS, X-ray diffraction and polarizing microscope and the copolymer prepared is a block one mainly.
产物经x -射线粉末衍射(XRD)、透射电子显微镜(TEM)和高分辨电子显微镜(HRTEM)表征。
They were characterized by X-ray powder diffraction (XRD), transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM).
用拉曼散射，X射线衍射、电子显微镜等方法进行了结构表征。
The structure of the film was characterized by Raman scattering, X-ray diffraction and scanning electron microscope.
利用X射线衍射仪和场致发射扫描电子显微镜等手段对合成粉体的相组成、结构和形貌进行了研究。
The phase composition and microstructure of mullite powders were investigated by X-ray diffraction and field emission scanning election microscopy techniques.
以X射线衍射（XRD）、透射电子显微镜（TEM）、发射光谱和衰减时间谱等手段表征材料性能。
The morphology, structure, and photoluminescence(PL) of the phosphors were investigated by transmission electron microscope(TEM), X-ray diffraction(XRD), emission spectra, and decay time.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
利用金相显微镜、X射线衍射仪、电子探针及滑动磨损试验机，研究了合金熔覆层的显微组织及性能。
The microstructure and properties of the composite coatings were investigated by optical microscopy, X-ray diffractometer, electron probe microanalyzer and a skimming wear machine.
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。
The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
聚合物的液晶行为用DSC、偏光显微镜和X射线衍射进行了表征，发现单体有热致液晶性；
The liquid crystalline behavior of the copolymers was characterized by DSC, polarizing microscopy with a heating stage and X ray diffractometer.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
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