利用广角X射线衍射分析仪对低熔点金属及合金填充聚合物材料体系的结晶行为进行了研究。
The crystallization property of polymer matrix filled with low melting metals and alloy was studied by wide-angle X-ray diffraction.
利用光学金相显微镜、显微硬度计、电子探针及X射线衍射分析仪初步探索其中温回火转变过程。
Optical metallographic microscope, micro-hardness tester, electron microprobe and X-ray diffraction analysis were applied to explore the process of intermediate temperature tempering transformation.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
利用FE-SEM、能谱分析仪（EDS）和X射线衍射分析（XRD）对其进行了表征和分析。
They were characterized and analyzed by FE-SEM, Energy Dispersive System(EDS) and X-ray Diffraction (XRD).
用X射线衍射法对其结构及其成份进行了表征，用铁电分析仪（RT66A）测试了其铁电性。
The X-ray diffraction(XRD) were employed to analyze the structure and composition of BYT thin films. The ferroelectric measurements were performed using a RT66A ferroelectric tester.
借助X射线衍射和阻抗分析仪对其相结构和介电性能进行了测试。
The phase structures and dielectric properties were investigated by X-ray diffraction and impedance analyzer.
借助X射线衍射和阻抗分析仪对其相结构和介电性能进行了测试。
The phase structures and dielectric properties were investigated by X-ray diffraction and impedance analyzer.
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