X射线能量色散谱（EDS）分析方法在材料领域得到了广泛的应用。
The application of X-ray energy dispersive spectroscopy(EDS) is widespread in materials research.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
使用扫描电镜（SEM）、X射线衍射（XRD）、X射线能量色散谱仪（EDAX）、显微硬度仪等设备检验了涂层的组织和性能。
The microstructure and mechanic performances of the coating were tested by SEM, XRD, EDAX, microhardness tester and other equipments.
将要讨论的技术包括：波长和能量色散谱，扫描背散射电子，二次电子，阴极射线磷光和X射线成像。
Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging.
将要讨论的技术包括：波长和能量色散谱，扫描背散射电子，二次电子，阴极射线磷光和X射线成像。
Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging.
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