用x -射线能谱仪测定了界面相的化学成分。
The chemical composition of the interfacial phase was analyzed by EDAX.
并通过X射线能谱仪（EDS）分别测定了膜在氧化和还原状态下的元素组成。
The elementary composition of NiHCF films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS).
通过X射线能谱仪、扫描电镜与傅立叶变换红外光谱研究纳米颗粒的组成及其微观结构；
The composition and microstructure of nanocomposite particles were analyzed by fourier transform infrared spectroscopy, energy dispersive X-ray spectroscopy, and scanning electron microscope.
应用x射线能谱仪和x射线衍射仪分别对腐蚀产物及管表面宏观残余应力进行定量分析。
Quantitative analyses have been made on the composition of corroded products and the macro-residual stress on the pipe surface by EDX and XRD.
应用扫描电镜及X射线能谱仪等设备，对采用线切割制取的裂纹样品内表面的黑色不明物进行了分析。
The black abstract material which sticks to inside crack of the sample machined by wire-electrode cutting is analyzed and studied by using scanning electron microscope and X-ray energy spectrometer.
射线能谱仪分析结果表明界面间的元素扩散十分强烈，并由此促进了覆铝钢板与搪瓷层形成良好的密着。
The X-ray photoelectron spectroscopic analysis showed that there existed a strong elemental diffusion at interface which resulted in the strong adherence between the enamel and aluminum-coated steel.
配备X射线能谱仪的扫描电镜和电子探针已广泛的应用于分析领域，是最为主要的微区成分分析的工具。
Energy Dispersive Spectrometer (EDS) has been widely applied to analytical field with electron probe and scanning electron microscopy, and it is the main tool of element analysis.
采用扫描电子显微镜（SEM）观察渗层表面、截面形貌，X射线能谱仪（EDS）检测渗层界面元素分布。
The microstructure and element distribution of the coating were investigated by scanning electric microscopy (SEM) and energy dispersive X-ray spectroscopy(EDS).
对模拟火灾不同受热条件下的炭化白松样品进行了扫描电镜(sem)和x -射线能谱仪(EDS)分析。
The white pine carbonization samples were analyzed by scanning electron microscope (SEM) and X-ray energy dispersive analysis (EDS) on different simulating fire conditions.
此外采用扫描电镜、X射线能谱仪对锡铋光亮镀层的成分进行分析，结果表明铋含量为1%，锡含量为99%。
In addition, the composition of bright Sn-Bi plated layer is analyzed using scanning electron microscope and X-ray energy spectrograph. The result shows Bi content is 1% and Sn content is 99%.
通过X射线能谱仪（EDS）和X射线光电子能谱（XPS）分别测定了复合膜在氧化和还原状态下的元素组成。
The elementary composition of PANI-SnP composite films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS).
利用扫描电子显微镜和X射线能谱仪对在厦门湾采集的水体悬浮颗粒物进行形态观察和X射线能谱微区元素分析。
Suspended particulate matters in water environment collected from western Xiamen Bay were analyzed using scanning electron microscope(SEM) and energy dispersive X-ray spectroscopy(EDS).
对模拟火灾不同受热温度条件下的炭化红松样品，进行了扫描电镜(sem)和x -射线能谱仪(EDS)分析。
In this paper, Korean pine carbonization samples were analyzed at different heating temperatures by scanning electron microscope (SEM) and X-ray energy dispersive analysis (EDS).
最后指出，中间标样法不但在x射线能谱仪中可以实行，在电子探针中也可以实行，并举例了已有的实验以资证明。
The feasibility of the medium standard method is proved to be true not only of the energy spectrometer of X-rays but also of the electron probe. Some experimental facts are rep…
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
本文对家猫针毛的形态结构进行了扫描电镜（SEM）观察，并且利用X射线能谱仪（EDAX）分别对鳞片层、皮质层和髓质层进行了元素分析。
The morphological structure of moggy guard fur was observed by SEM. The elements in squama, cortex and medulla were also analyzed by EDAX.
探测效率是X射线光电子能谱仪一个很重要的仪器参数。
Detective efficiency is an important instrumental parameter of X ray photoelectron spectrometer.
用扫描电子显微镜(sem)和X射线光电子能谱仪(XPS)对钢球磨损表面进行了分析。
The worn surfaces of the steel balls were analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).
本文应用XPS（X射线光电子能谱仪）研究了真空烘烤对碘化铯光阴极化学状态的影响。
The effects of vacuum-baking on the chemical state of CsI photocathodes are studied with X-ray photoelectron spectroscopy (XPS).
采用扫描电子显微镜(sem)、X射线光电子能谱仪(XPS)、傅立叶红外光谱仪(IR)对盘上磨痕进行表面分析。
The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
产品通过X射线衍射(XRD)、扫描电镜(sem)、能谱仪(EDS)测试，说明块料直接煅烧法生产的方石英具有转化率高、加工性能好、成本低等特点。
By tests of XRD, SEM, EDS, this processing technology has the advantages of high transformation, good processing capability and lower pay out and so on.
用X射线光电子能谱仪(XPS)研究了仿制的铜红袖的着色机理。
The colour mechanism of imitated copper-red glaze was studied under the use of XPS.
使用扫描电镜、能谱仪、X射线衍射仪，对广西六种典型花岗岩所含元素、石英相结构及微观形貌进行了测试分析。
The elements, phase structure of quartz and micro-morphology of six types of granite in Guangxi were analyzed by SEM, EDX XRD.
本文提供了北京正负电子对撞机同步辐射光束线上X射线能谱的首次测量结果，文章对探测器和谱仪系统、测量方法及数据分析予以扼要的描述。
This paper provides the first measurement results of X-ray spectrum at the beam lines of synchrotron radiation. It describes the detector and spectral system, measuring method and data acquisition.
利用扫描电镜、能谱仪、X射线衍射等法对熔 覆合金层、合金 层与 钢基体的结合界面等进行了显微组织及相结构的分析。
The microstructure and phase constitution of the coat and the boundary between coat and substrate were studied with SEM, EDX and X-ray analysis techniques.
采用扫描电子显微镜(sem)、能谱仪(EDS)、X射线衍射仪(XRD)等仪器研究了氧化膜的形貌、组成和相结构。
The microstructure, morphology and components of the oxide film are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy disperse spectroscopy (EDS).
采用光学显微镜、扫描电子显微镜、能谱和X射线衍射仪分析了梯度材料各层及界面微观组织、相组成和元素分布。
The microstructure and phase composition of each layer as well as component distribution of elements across the interfaces of the layers were analyzed by means of OM, SEM, EDS and XRD.
X射线衍射仪、电子能谱仪、原子力显微镜和椭圆偏振仪等研究薄膜的击穿电压、介电常数、晶体结构、化学成分、表面形貌及薄膜的折射率。
The breakdown voltage, permittivity, crystal structure, composition, surface and refractive index of the thin films were studied by I-V, C-V, XRD, EDS, AFM and elliptical polarization instrument.
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