利用X射线衍射、扫描电子显微镜和分光光度计对制备的V2O5薄膜的结构、形貌和光学特性进行研究。
The microstructure, the morphology and optical properties of V2O5 thin films were studied by XRD, SEM and spectrophotometer.
利用X射线衍射仪、扫描电子显微镜和荧光分光光度计对样品的晶体结构和光学性质进行了分析。
The structural and optical characteristics were studied by X-ray diffraction, scanning electron microscopy and Photoluminescence spectrum.
利用X射线衍射仪、扫描电子显微镜和荧光分光光度计对样品的晶体结构和光学性质进行了分析。
The structural and optical characteristics were studied by X-ray diffraction, scanning electron microscopy and Photoluminescence spectrum.
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