用标准晶片掠出射x射线荧光曲线的微分评测了实际角发散度的大小。
Practical divergent Angle is evaluated by the derivative of the standard wafer's grazing-exit X-ray fluorescence curve.
用标准晶片掠出射x射线荧光曲线的微分评测了实际角发散度的大小。
Practical divergent Angle is evaluated by the derivative of the standard wafer's grazing-exit X-ray fluorescence curve.
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