探测效率是X射线光电子能谱仪一个很重要的仪器参数。
Detective efficiency is an important instrumental parameter of X ray photoelectron spectrometer.
用扫描电子显微镜(sem)和X射线光电子能谱仪(XPS)对钢球磨损表面进行了分析。
The worn surfaces of the steel balls were analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).
本文应用XPS（X射线光电子能谱仪）研究了真空烘烤对碘化铯光阴极化学状态的影响。
The effects of vacuum-baking on the chemical state of CsI photocathodes are studied with X-ray photoelectron spectroscopy (XPS).
报道了利用红外吸收谱、X射线光电子谱和表面张力测试仪对新型半导体清洗工艺进行研究的结果。
A new type technique of semiconductor cleaning is studied via infrared absorption spectra, X ray photoelectron spectra and surface tension detector.
采用扫描电子显微镜(sem)、X射线光电子能谱仪(XPS)、傅立叶红外光谱仪(IR)对盘上磨痕进行表面分析。
The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).
用X射线光电子能谱仪(XPS)研究了仿制的铜红袖的着色机理。
The colour mechanism of imitated copper-red glaze was studied under the use of XPS.
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
通过X射线能谱仪（EDS）和X射线光电子能谱（XPS）分别测定了复合膜在氧化和还原状态下的元素组成。
The elementary composition of PANI-SnP composite films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS).
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
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