已经设计出专门的探头来测量半导体晶圆片和半导体棒的电阻率。
Special probes have been designed for making resistivity measurements on semiconductor wafers and bars.
结果表明：随着触媒中碳化硼添加量的增加，含硼金刚石单晶的电阻率降低，可呈现半导体电阻特性。
The results show that the specific resistance of the boron-doped diamonds significantly decreased with the increase of boron concentration and to be a semiconductor.
各种低阻测量的应用包括：接触电阻、超导体电阻和导体电阻率的测量等。
Low resistance measurement applications include contact resistance, superconductor resistance, and resistivity measurements of conductors.
各种低阻测量的应用：接点电阻测量、超导体电阻测量以及导电材料的电阻率测量等。
Low resistance measurement Applications: Contact resistance, superconductor resistance measurements, and resistivity measurements of conductive materials.
本文对影响金属导体材料体积电阻率的仲裁试验测定的因素进行误差分析，并指出如何能准确的测定。
Factors affecting the accuracy of the measurement of volume resistivity of metallic conductors in the arbitration test are analyzed. Ways of how to make accurate measurements are provided.
为了解铜氧化物高温超导体的正常态输运特性对其超导电性的影响，我们对不同温度烧结样品正常态电阻率和超导电性之关联进行了系统的研究。
In order to know the influence of the superconductivity by normal properties of the cuprate superconductor, the relationship between the normal resistivity and the superconductivity was studied.
本文报导了用微波介质波导反射法无接触测量半导体电阻率的实验装置。
We have designed a contactless measurement apparatus by a microwave dielectric waveguide reflection method.
本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。
In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.
弄清尺寸对电阻率的影响，对于分析复合导体的磁-热稳定性，设计复合导体的截面构型和判定、合理选用稳定化用铜是有重要意义的。
This phenomenon is important for analysing the magnetic-thermal stability and designing cross section and selecting copper for multi-filamentary superconducting composites.
弄清尺寸对电阻率的影响，对于分析复合导体的磁-热稳定性，设计复合导体的截面构型和判定、合理选用稳定化用铜是有重要意义的。
This phenomenon is important for analysing the magnetic-thermal stability and designing cross section and selecting copper for multi-filamentary superconducting composites.
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