本文利用扩展电阻技术对半导体硅、硅基材料进行测试分析，从而用以开发新材料和评估材料的质量。
We use spreading Resistance technique to test and analyze silicon and silica base materials. This technique is more suitable to control material quality and develop new materials.
图4 -44示出一个基本的测量超导体电阻的测试系统。该系统使用2182a型纳伏表和6220型电流源来测量电阻。
Figure 4-44 shows a basic superconductor resistance measurement test system using the combination of a Model 2182a Nanovoltmeter and a Model 6220 Current Source for measuring the resistance.
本文中提出了一种测量金属-半导体欧姆接触比接触电阻的新方法-圆环结构测试法。
In this paper, a method to determine the specific contact resistance of metal-semiconductor contact — circular ring structure method is presented.
本文中提出了一种测量金属-半导体欧姆接触比接触电阻的新方法-圆环结构测试法。
In this paper, a method to determine the specific contact resistance of metal-semiconductor contact — circular ring structure method is presented.
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