仿真结果表明,该方法操作简单、有效,故障覆盖率达到了90%,是一种很可行的存储器板测试生成方法。
The result indicates that the technology manipulates easily and is effective, the fault coverage reaches 90%, it is a feasible test generation technology.
仿真结果表明,该方法操作简单、有效,故障覆盖率达到了90%,是一种很可行的存储器板测试生成方法。
The result indicates that the technology manipulates easily and is effective, the fault coverage reaches 90%, it is a feasible test generation technology.
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