本文主要论述集成电路加速寿命测试理论方法和IC常见失效模式。

The paper mainly dwells on the common failure modes and the IC accelerating life span test theory and technology.

youdao

本文主要论述集成电路加速寿命测试理论方法和IC常见失效模式。

The paper mainly dwells on the common failure modes and the IC accelerating life span test theory and technology.

youdao