提出一个利用多层膜小角X射线衍射谱衍射峰积分强度计算多层膜界面粗糙度的公式。
A simple formula for calculating the interfacial roughness of multilayer by using the small Angle X ray diffraction curves of the samples is given.
本文对电孤放电和催化剂热解碳氢气法制备的多层直形纳米碳管的倒空间及其螺旋度，采用电子衍射进行了研究。
Straight carbon nanotubes with multishells produced by arc discharge and pyrolysis of organic gases using metal particles as catalysts have been investigated by means of electron diffraction.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
文中还对多层膜的膜厚测量、X射线双晶衍射实验以及扫描电镜的表面象和剖面象进行了分析。
Film thickness measurements, bicrystal X-ray diffraction experiments and surface and cross-sectional micro-photographs taken by S. E. M. for epitaxial films are also discussed.
这两种多层膜经透射电子显微镜和小角X射线衍射测量证明构成多层膜的单层膜上的纳米金颗粒是有序的，并且颗粒在层与层之间的排列也是有序的。
The two multilayers had ordered particles both on planes and in layer by layer, which were confirmed by TEM images and small-angle X-ray diffraction measurement.
这两种多层膜经透射电子显微镜和小角X射线衍射测量证明构成多层膜的单层膜上的纳米金颗粒是有序的，并且颗粒在层与层之间的排列也是有序的。
The two multilayers had ordered particles both on planes and in layer by layer, which were confirmed by TEM images and small-angle X-ray diffraction measurement.
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