采用椭偏光谱法分析了薄膜的结构，并提出多层膜模型模拟薄膜结构。
The structure of the laser crystallized poly-Si thin film is analyzed by using spectroscopic ellipsometry.
提出了晶体学模型来研究多层薄膜滚压的表面粗糙度。
A crystallographic model has been presented for the surface roughness modelling of thin sheet rolling.
提出了晶体学模型来研究多层薄膜滚压的表面粗糙度。
A crystallographic model has been presented for the surface roughness modelling of thin sheet rolling.
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