艾德温？阿姆斯特朗开发接收机电路—超外差式收音机。
Edwin armstrong develops a receiving circuit-the superheterodyne.
简朴分析了超外差式调幅收音机电路的工作原理及其组装和调试。
A simple analysis of the superheterodyne AM radio circuit and the principle of assembly and debugging.
六端口雷达与传统的超外差式雷达相比，结构简单，便于集成，成本低。
Compared with conventional super heterodyne radar, it presents several advantages such as reduced system complexity, allowing a higher level of circuit integration and low cost.
讨论了微波外差式光纤布里渊传感系统的信号检测原理、参数选择和系统性能。
The signal detection principle, preferences and the system performance are discussed in optical fiber Brillouin sensing system based on microwave heterodyne technique.
本论文首先分析了外差式连续波多普勒引信及锯齿波调频测距引信的原理和系统组成。
This paper discusses the principle and form of Heterodyne-CW Doppler fuze and Toothed-FM fuze firstly.
基于外差激光多普勒原理，设计并实现了一套光纤结构的外差式激光多普勒振动计(LDV)。
Base on the heterodyne laser Doppler theory, a heterodyne laser Doppler vibrometer (LDV) with fiber structure was designed and implemented.
系统中发射器采用编码器编码后发送超高频信号，接收器采用二次混频型超外差式接收移动目标信号。
The system uses the emitter to send ultra high frequency signals after coding with signal coder and the secondary superheterodyne mixing receiver to accept the moving target signals.
根据外差干涉计量术的原理，研制了非接触式的光外差干涉磁盘表面粗糙度测量仪。
This paper is concerned with the principle of a non - contact optical instrument for measuring the surface roughness of a magnetic disk with an opto-heterodyne interferometer.
结合激光外差干涉法和透射式椭偏测量原理，研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。
Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.
理论上详细推导了平衡式外差接收的数学模型。
In the article, the mathematical model of balanced heterodyne reception was detailed derived.
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
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