描述了场离子显微镜样品的制备，并得到曲率半径为500（?），表面光洁的钨针尖。
The tip of specimen for FIM analysis is prepared by "thin layer" electropolishing. A Clean tungsten tip about 500 A radius was prepared.
描述了场离子显微镜样品的制备，并得到曲率半径为500（?），表面光洁的钨针尖。
The tip of specimen for FIM analysis is prepared by "thin layer" electropolishing. A Clean tungsten tip about 500 A radius was prepared.
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