• 为了得到这些图像研究人员的是发射电子显微镜(Field - emissionelectron microscopeor FEEM)。

    To create these images, the researchers used a field-emission electron microscope, or FEEM.

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  • 通过X射线粉末衍射仪发射扫描电子显微镜荧光分光光度计分别表征样品晶体结构颗粒形貌发光性能

    The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.

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  • 利用X射线衍射仪致发射扫描电子显微镜手段合成粉体组成结构和形貌进行了研究

    The phase composition and microstructure of mullite powders were investigated by X-ray diffraction and field emission scanning election microscopy techniques.

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  • 动态光散射(DLS)、透射电子显微镜(TEM)发式扫描电子显微镜(FESEM)等阶段乳液聚合胶粒大小分布以及形态结构进行了表征

    The sizes and their distributions as well as morphologies of polymer microspheres at various emulsion polymerization steps were characterized by means of DLS, TEM and FESEM.

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  • 电子显微镜显示没有表面上形成均匀吸附份金膜反应形成颜色较暗的岛状合金

    Under TEM images, it was found that Hg didn't form a uniform adsorption layer on Au surface. Some portions of Au film reacted with Hg and became dark island-shaped alloys.

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  • 配有单色 器、球差校正 器、HR GIF一代发射枪透射电子显微镜可提供亚埃的空间分辨率电子伏特能量分辨率,为研究物质的原子 电子结构提供了可靠的保证。

    A sub-angstrom spatial resolution and sub-eV energy resolution can be reached in new type of FEG TEM in combination with monochromator, C_S corrector and HR-GIF.

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  • 配有单色 器、球差校正 器、HR GIF一代发射枪透射电子显微镜可提供亚埃的空间分辨率电子伏特能量分辨率,为研究物质的原子 电子结构提供了可靠的保证。

    A sub-angstrom spatial resolution and sub-eV energy resolution can be reached in new type of FEG TEM in combination with monochromator, C_S corrector and HR-GIF.

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