研制了一台集低能电子点源显微镜和场发射显微镜于一体的设备。
A facility has been developed that can function as a low-energy electron point source (LEEPS) microscope or a field-emission microscope (FEM).
为了得到这些图像，研究人员用的是场发射电子显微镜(Field - emissionelectron microscopeor FEEM)。
To create these images, the researchers used a field-emission electron microscope, or FEEM.
利用X射线衍射仪和场致发射扫描电子显微镜等手段对合成粉体的相组成、结构和形貌进行了研究。
The phase composition and microstructure of mullite powders were investigated by X-ray diffraction and field emission scanning election microscopy techniques.
通过X射线粉末衍射仪、场发射扫描电子显微镜和荧光分光光度计分别表征样品的晶体结构、颗粒形貌和发光性能。
The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.
配有单色 器、球差校正 器、HR GIF的新一代场发射枪透射电子显微镜可提供亚埃的空间分辨率和亚电子伏特的能量分辨率，为研究物质的原子 电子结构提供了可靠的保证。
A sub-angstrom spatial resolution and sub-eV energy resolution can be reached in new type of FEG TEM in combination with monochromator, C_S corrector and HR-GIF.
配有单色 器、球差校正 器、HR GIF的新一代场发射枪透射电子显微镜可提供亚埃的空间分辨率和亚电子伏特的能量分辨率，为研究物质的原子 电子结构提供了可靠的保证。
A sub-angstrom spatial resolution and sub-eV energy resolution can be reached in new type of FEG TEM in combination with monochromator, C_S corrector and HR-GIF.
应用推荐