场发射扫描电镜照片显示碳化硅主要有不规则的六角片堆积而成花状结构。
Field emission scanning electron microscopy images show that the SiC flower-like structures deposited by irregular hexagon.
采用聚焦离子束和场发射扫描电镜对处于临界破坏状态的节瘤缺陷做剖面分析和观察。
Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.
利用粉末X射线衍射（XRD）、扫描电镜（SEM）和场发射扫描电镜（FE-SEM）对所得产物进行表征。
The obtained products were characterized by powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and field-emission scanning electron microscopy (FE-SEM).
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
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