故障模型为单重和多重固定故障。
本文将机车继电器控制电路等效为数字组合逻辑电路，建立了它的固定故障等效模型。
The electric locomotive bang-bang circuit is converted into an equivalent digitalcombinational logic circuit for setting up its stuck-at fault model.
详细分析了固定故障所反映出的状态变换特征，提出状态变换故障模型以及相对应的测试生成压缩方法；
This paper describes state transition fault and collapsing of test generation basis of the character of fixed fault.
目前常用的故障模型主要有：固定故障，开路故障，桥接故障，存储故障，时滞故障等。
At present the commonly used fault models mainly consist of stuck-at fault, stuck-open fault, bridge fault, store fault, delay fault, etc.
基于固定型故障模型的测试方法已不能满足高性能集成电路，尤其是对CMOS电路的测试要求。
Testing based on stuck-at fault model is insufficient for high performance ICs, especially for CMOS circuits.
基于固定型故障模型的测试方法已不能满足高性能集成电路，尤其是对CMOS电路的测试要求。
Testing based on stuck-at fault model is insufficient for high performance ICs, especially for CMOS circuits.
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