测量电阻率的四探针法公式中，要求是点接触而且探针的排列有一定的形状。
The equation of four probes method for resistivity measurement requires point contacts and a definite configuration of probes array.
四探针法测量了薄膜电性能，薄膜电阻率平均变化达到103，比理论上只相差一个数量级；
The ratio of resistance change is tested using Four Probes Method. The average change reaches 103, and is near to 104 of the theory estimation.
采用排水法测试试样密度，利用SEM和EDX分析微观结构和元素组成，采用四探针法测量电阻率。
Density of the fired specimens was determined. Microstructure and element composition were examined by SEM and EDX.
本论文依据四探针法的基本原理并结合双脉冲技术，设计并制造适用于薄膜温差电材料的电阻率测试系统。
The thin film TE material resistivity measurement system which is designed in the thesis bases on the principle of four-probe method and double pulse technology.
与四点同线探针法一样，如果样品电阻和电压表的绝缘电阻（电压表的公共端到地）是同一数量级的，就可能需要使用差分测量。
As with the four-point collinear probe method, a differential measurement may be required if the sample resistance is of the same magnitude as the isolation (meter common to ground) of the voltmeter.
与四点同线探针法一样，如果样品电阻和电压表的绝缘电阻（电压表的公共端到地）是同一数量级的，就可能需要使用差分测量。
As with the four-point collinear probe method, a differential measurement may be required if the sample resistance is of the same magnitude as the isolation (meter common to ground) of the voltmeter.
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