如果输入端的短路点具有很低的热电动势，用这种方法就可以验证输入噪声和零点随时间的漂移。
If the short circuit has a very low thermoelectric EMF, this can be used to verify input noise and zero drift with time.
如果输入端的短路点具有很低的热电动势，用这种方法就可以验证输入噪声和零点随时间的漂移。
If the short circuit has a very low thermoelectric EMF, this can be used to verify input noise and zero drift with time.
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