本文还讨论了两种智能故障诊断技术，即专家系统智能故障诊断技术和边界扫描测试智能故障诊断技术。
The paper also discusses two intelligent fault diagnostic methods: expert system intelligent fault diagnostic method and boundary-scan technique intelligent fault diagnostic method.
介绍了数据采集的原理和ASIC的基本功能、实现以及JTAG的边界扫描测试技术。
In this paper, the principle of data collection, the basic function and implementation of asic and the technology of JTAG BST are presented.
JTAG边界扫描机制是用于在线导通测试的新技术，利用JTAG可以在数分钟内查出复杂插件和系统的全部导通故障。
JTAG Boundary Scan is a new technique for connection test. With the help of JTAG, we can find out all connection faults of a complicated board or system.
随着芯片集成度和印刷电路板复杂度的不断提高，边界扫描测试技术在芯片故障检测中的应用越来越广泛。
With the continual improvement of the chip's integration level and complexity of print circuit board, the application of boundary scan test technology becomes wider and wider in testing ICs.
文中介绍JTAG边界扫描的概念、技术特点，以及在芯片功能测试、系统诊断、仿真、性能分析和导通测试方面的应用。
This paper focuses on the JTAG ideas and technical characteristics and summarizes the JTAG usage in chip function test, system diagnosis, simulation, performance analysis and conduction test.
扫描技术和边界扫描技术是目前可测试性设计的主流技术，可分别用来解决芯片内部与芯片之间的可测试性问题。
Scan technique and boundary scan technique are the main stream technology of current DFT technique. They can solve the internal testable problems and the connection problems between ICs respectively.
本文在对目前主要的可测性设计方法进行研究的基础上，根据所设计CPU的结构特点，采用了边界扫描技术和基于BILBO的内建自测试技术结合的可测性设计方案。
Based on the research of primary DFT method and the structure characteristic of designed CPU, the article combines the boundary scan and Build-In Self-Test based on BILBO to test.
本文提出将测试领域成熟的边界扫描技术应用在实验系统中，解决配置和验证两大关键问题。
The paper proposes applying boundary-scan technology which is widely used in the domain of test to the computer hardware experiment to resolve the two crucial problems of configuration and test.
本文提出将测试领域成熟的边界扫描技术应用在实验系统中，解决配置和验证两大关键问题。
The paper proposes applying boundary-scan technology which is widely used in the domain of test to the computer hardware experiment to resolve the two crucial problems of configuration and test.
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