用X射线和原子力显微镜对其进行了表征。
The samples were characterized by the X-ray and Atom Force Microscope.
利用LB技术和原子力显微镜(afm)研究表面活性剂混合不溶膜的结构。
Mixed monolayers of surfactants were investigated by AFM and LB technique.
介绍了扫描隧道显微镜(STM)和原子力显微镜(afm)的原理和目前情况。
This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).
利用荧光显微镜和原子力显微镜我们第一次观察到J -聚集体的形貌随着湿度的变化而变化。
For the first time, we observed the transformation of the J-aggregates morphologies depending on the surrounding humidity by fluorescence microscopy and atomic force microscopy.
用激光拉曼谱和原子力显微镜等现代分析手段研究了磁控溅射石墨靶制备的薄膜的结构和特性。
Raman spectrometer and atom force microscope were employed to study and determine the structure and characteristics of the films prepared by the method of magnetron sputtering with graphite target.
利用红外吸收谱、X射线光电子谱和原子力显微镜等，把它和标准rca清洗工艺的清洗效果做了比较。
The results of cleaning using the new type of cleaning technique and RCA standard cleaning technique are compared. The results are obtained by X ray photoelectron spectra?
采用扫描电镜（ S E M ）和原子力显微镜（ A F M ）分别对膜的断面、表面形态作了研究。
The cross section and surface image of NF 1 composite membrane were studied by SEM and AFM respectively.
运用差示扫描量热分析、动态力学分析、交流复阻抗谱、扫描电镜和原子力显微镜对体系性能和形态进行了研究。
DSC, DMA, complex impedance analysis, SEM, and AFM were used to investigate the properties and morphology of the system.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
并用扫描电子显微镜(sem)、透射电子显微镜(TEM)和原子力显微镜(afm)对阳极氧化铝膜的形貌和结构进行了表征。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). Transmission electron microscopy (TEM) and atom force microscopy (AFM).
实验中对硅烷膜用X-射线光电子能谱（XPS）、现场表面增强拉曼散射光谱（SERS）和原子力显微镜（AFM）进行了表征。
The silane films were characterized by Xray photoelectron spectroscopy (XPS), insitu Surfaceenhanced Raman spectroscopy (SERS), atom force microscopy (AFM).
应用电化学弱极化法和原子力显微镜（AFM）研究了咪唑啉衍生物类缓蚀剂在模拟深层气井水溶液中对碳钢的二氧化碳腐蚀的抑制效果和缓蚀作用机理。
The electrochemical method and atomic force microscope(AFM) were applied to study the inhibition mechanism of Im-D, an imidazoline derivate inhibitor, for mild steel in CO2 saturated solution.
该技术由瑞士国家科学基金会和帕卡德基金会提供资金支持，它通过编程来控制原子力显微镜（AFM）工作。
The method, developed with support from the Swiss National Science Foundation and the Packard Foundation, works by changing the programming that controls an Atomic Force Microscope (AFM).
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
列维和他的同事们用原子力显微镜和两片绝缘体（镧氧化铝和锶钛氧化物），研制出了一枚纳米晶体管。
Using an atomic force microscope and two layers of insulators (lanthanum aluminum oxide and strontium titanium oxide), Levy and his colleagues created a nanoscale transistor.
同时应用原子力显微镜对金膜和聚氨酯材料的超微结构与材料表面上所吸附的蛋白质进行了表征。
The surface of the gold film, the microstructure of the polyurethane film and the surfaces with adsorbed proteins were imaged with an atomic force microscope (AFM).
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。
Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.
用动态激光光散射（DLS），原子力显微镜（AFM）和透射电镜（TEM）等测试方法对配合物胶束的形态及尺寸进行了表征。
The morphologies and sizes of the micelles were characterized by dynamic laser scattering (DLS), atomic force microscopy (AFM) and trans-mission electron microscopy (TEM) and so on.
简述了原子力显微镜(afm)的工作原理和特点，以及在多糖，特别是在淀粉结构研究中的进展。
The principle and some features of atomic force microscopy (AFM) are briefly reviewed. And advances in study on the structure of polysaccharide, especially starch by AFM are presented.
阐述了基于原子力显微镜(afm)的弯曲测试测量纳米梁杨氏模量的理论和方法。
The theory and method of bending test on nanobeam for the measurement of Young's modulus based on atomic force microscope (AFM) are introduced.
原子力显微镜分子成像和纳米操纵技术在生物医学中具有广阔的应用前景。
Atomic force microscope molecular imaging and nanometer manipulation will be widely applied on biomedicine.
应用原子力显微镜（AFM）研究硫酸盐还原菌（SRB）、微生物膜、腐蚀产物膜和A3钢腐蚀后的表面形貌，获得了高分辨率、清晰的图像。
The morphology of sulfate-reducing bacteria(SRB), microbial biofilms, corrosion product film and corroded A3 steel have been observed by atomic force microscopy(AFM).
采用原子力显微镜和低温氮吸附法研究了桉木浆纤维的孔隙结构，并运用分形理论对孔隙结构进行了分析。
The pore structure of eucalyptus pulp fibers was investigated by means of atomic force microscopy (AFM) and low-temperature nitrogen adsorption.
阐述了基于原子力显微镜(afm)的弯曲测试测量纳米梁杨氏模量的理论和方法。
The theory and method of bending test on silicon nanobeam for the thickness measurement based on atomic force microscope (AFM) are introduced.
用于生物体系成象的原子力显微镜等新的分析技术以及其它表面和材料分析的技术已经或即将推出商品化的仪器。
Atomic force microscopy for the imaging of biological systems, and other techniques for surface and materials analysis are already, or may soon be, appearing as commercialized instruments.
采用原子力显微镜(afm)和光谱等方法对一些生物有机分子在不同表面的自组装结构进行了研究，主要结果如下：1。
Atomic Force Microscopy (AFM) and spectroscopy have been used to study self-assembly structures of different bioorganic molecules on various substrate, the main results are as follows: 1.
利用原子力显微镜、能量散射X射线谱、X射线衍射和交变梯度磁强计研究了该颗粒膜材料的结构和磁学性质。
The structural and magnetic properties of the granular film are studied by atomic force microscope, energy dispersion X-ray spectrum, X-ray diffraction, and alternating gradient magnetometer.
并且分别利用原子力显微镜和傅立叶变换红外光谱对薄膜进行界面形态和微观结构分析。
The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).
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