可测试性设计(DFT)技术被提了出来。
介绍了一种新颖的系统级可测试性设计策略。
A new method of the system level design for measurability is introduced in this paper.
首先对测试技术和可测试性设计的一些方法做出了综述。
First of all, several methods about testing technology and design for testability and SoC test techniques are summarized.
本文提出了一种基于知识的可测试性设计(DFT)方法。
In this paper, a knowledge-based design for testability (DFT), is presented.
可测试性设计可以增强软件的可测试性，降低测试的强度。
Design for software testability can increase the testability of software as the same time, reduce the stress of software testing.
本文提出了一种离散余弦变换电路VLSI实现的可测试性设计。
In this paper, a VLSI implementation method of design-for-testability for DCT is presented.
在系统芯片可测试性设计中考虑功耗优化问题是当前国际上新出现的研究领域。
Considering power optimization in design for testability of system-on-a-chip is a newly emerging research region.
此外，发现用二进计数序列作为测试输入对于差错特征量可测试性设计有一定优点。
Besides, it is discovered that there are some merits for error signature analysis and testability design when binary counting sequences are used as the testing input.
目前常见的可测试性设计方法主要有改善设计法、结构设计法和边界扫描测试法等几种。
There are some common methods of design for testability, such as boundary scan test and so on.
边界扫描技术是一种标准的数字电路测试及可测试性设计方法，它在工业界得到了广泛的应用。
As a standard technique of test and Design-For-Testability for testing the digital printed circuit board, Boundary-Scan technique has obtained widespread application in electronic equipment.
本文从可测试性设计的角度出发，讨论了测试综合技术的必要性，以及测试综合的方法与步骤。
In this paper, from the point of view of the design for testability, we discussed the necessary of the test synthesis technology, and also discussed the methods and steps of the test synthesis.
该文讨论了软件可测试性的特征和影响软件测试的因素，以及改进软件可测试性设计的几种方法。
This paper discusses the feature and factors of software testability, and the method how to improve the design of software testability.
在可测试性设计中考虑功耗的主要原因是数字电路在测试方式下的功耗比系统在正常工作方式下高很多。
Its main reason is that the power assumption of digital circuits in test mode is very higher than that in normal system operation mode.
可测试性设计是现代芯片设计中的关键环节，针对无线接入芯片的可测试性设计对测试技术有更高的要求。
Design for test is an important process in the chip design nowadays, testability design of wireless chip needs a much higher requirement of test technology.
扫描技术和边界扫描技术是目前可测试性设计的主流技术，可分别用来解决芯片内部与芯片之间的可测试性问题。
Scan technique and boundary scan technique are the main stream technology of current DFT technique. They can solve the internal testable problems and the connection problems between ICs respectively.
本文在介绍机载计算机的可测试性设计原理和测试分类的基础上，提出了在不同的测试级别上的可测试性工程设计技术。
On the basis of design for testability in airborne computer principle and testability classification, design technique of testability in different test hiberarchy is presented.
随着星载软件复杂度的增加，提高软件测试效率对保证软件质量越来越重要，软件的可测试性设计成为提高软件测试效率的关键手段。
Satellite's on-board software is much more complex than before, so how to improve test efficiency of satellite software is very important for its quality.
摘要随着星载软件复杂度的增加，提高软件测试效率对保证软件质量越来越重要，软件的可测试性设计成为提高软件测试效率的关键手段。
Abstract: satellite's on-board software is much more complex than before, so how to improve test efficiency of satellite software is very important for its quality.
附带的好处是这些数据绑定框架在与适当的GUI设计模式结合使用时能够提高可测试性。
As an added benefit, they can also increase testability when combined with proper GUI design patterns.
将方面编写为可测试的，得到的设计好处与通过重构面向对象的代码来实现可测试性所得到的好处相似。
Writing aspects to be testable yields design benefits parallel to those achieved by factoring object-oriented code for testability.
用户还可能会审视实际的架构、仔细审阅其可测试性、可维护性、设计完整性、可复制性、避免独占等等。
Prospective users should also look at the actual architecture emitted and critically review it for testability, maintainability, design integrity, duplication, lock-in avoidance etc.
然后，设计、测试、再测试，以确保性能、可伸缩性及互操作性需求得到了满足。
Then design, test, and retest to confirm that your performance, scalability and interoperability requirements are met.
需求、设计以及代码和测试需求之间的可跟踪性非常有限。
There is limited traceability between requirements, design, and code and test requirements.
重要模式包括契约式设计、定义良好的接口、可组合性、可预测的行为和组件测试。
Significant patterns include design by contract, well-defined interfaces, composability, predictable behavior, and component testing.
在使代码变得更具可测试性的过程中，我们对前面一些有问题的代码进行了重构；这些代码不仅设计上有问题，功能上也有问题。
In the process of making code testable, we've refactored previously problematic code; not only problematic in it's design but in it's function.
集成电路规模的增加，使电路的可测试性成了设计阶段必须考虑的问题，这就需要预先确定电路中各部份的测试性能。
As the scale of IC is increasing, its testability must be taken into account in the course of circuit design and the testability measure of circuits should be determined.
此外，电路的消耗功率和可测试性也是我们设计上的考虑重点。
Moreover, power and testability issue of the design are also considered.
通过可测性设计，使该电路的测试难度及测试时间减少了将近一半。
By design for testability, both the degree of difficulty in testing and test time are reduced nearly one half.
电子系统的设计必须考虑可测试性。
The design for digital electronic systems must consider the testability.
电子系统的设计必须考虑可测试性。
The design for digital electronic systems must consider the testability.
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