双晶衍射仪的分辨本领高，测量范围小，最适合作小角散射测量。
Double crystal diffractometer applied to measure SAXS is very satisfactory, since it has high resolving power and relatively small measure area.
用X射线双晶衍射仪扫描并分析了典型双势垒RTD样品的衍射摇摆曲线；
The results of double crystal X, ray diffraction measure of typical double barrier RTD material were given.
对双晶衍射仪实行改造，用一台PC _ 401微机直接控制和进行小角散射等测量。
PC_401 computer system was introduced to the double crystal goniometer for small Angle scattering measurement.
用X射线双晶衍射仪测量了阴极和玻璃热粘结工艺过程中阴极材料外延层和衬底的双晶回摆曲线。
Some double crystal rocking curves of photocathode epitaxy materials and substrates are measured by means of X-ray double crystal diffraction in the bonding process.
用X射线双晶衍射仪测量了阴极和玻璃热粘结工艺过程中阴极材料外延层和衬底的双晶回摆曲线。
Some double crystal rocking curves of photocathode epitaxy materials and substrates are measured by means of X-ray double crystal diffraction in the bonding process.
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