利用X射线双晶衍射分析了晶体的完整性。
The lattice perfection of the InAs single crystal is studied with X-ray diffraction.
从双晶衍射半峰宽值可以评估硅片的抗弯强度。
By the halfwidth of rocking curve we can estimate the bending stress of silicon wafer.
双晶衍射仪的分辨本领高，测量范围小，最适合作小角散射测量。
Double crystal diffractometer applied to measure SAXS is very satisfactory, since it has high resolving power and relatively small measure area.
用X射线双晶衍射仪扫描并分析了典型双势垒RTD样品的衍射摇摆曲线；
The results of double crystal X, ray diffraction measure of typical double barrier RTD material were given.
对双晶衍射仪实行改造，用一台PC _ 401微机直接控制和进行小角散射等测量。
PC_401 computer system was introduced to the double crystal goniometer for small Angle scattering measurement.
文中还对多层膜的膜厚测量、X射线双晶衍射实验以及扫描电镜的表面象和剖面象进行了分析。
Film thickness measurements, bicrystal X-ray diffraction experiments and surface and cross-sectional micro-photographs taken by S. E. M. for epitaxial films are also discussed.
用X射线双晶衍射仪测量了阴极和玻璃热粘结工艺过程中阴极材料外延层和衬底的双晶回摆曲线。
Some double crystal rocking curves of photocathode epitaxy materials and substrates are measured by means of X-ray double crystal diffraction in the bonding process.
作者利用双晶X射线衍射技术，研究了不同切割速率下硅晶片的切割损伤。
By means of technique of X-ray double crystal diffraction, the different cutting damages of silicon slices have been studied.
为了更好地研究双晶片的特性，利用扫描电镜(sem)和x -射线衍射(XRD)技术，对PZT薄膜的特性进行了较为详细的研究。
In order to describe the characteristics of piezoelectric bimorph, properties of PZT film are studied by SEM and XRD.
本文报道了我国最近发现的硅硼镁铝矿晶胞参数、微双晶结构的电子衍射分析，晶体缺陷和矿物高分辨点阵象的透射电镜观测结果。
This paper has presented the results of TEM studies about the unit cell para-meters, micro-twinning structure, crystal defect and lattice fringe image of grandidierite discovered in China recently.
本文报道了我国最近发现的硅硼镁铝矿晶胞参数、微双晶结构的电子衍射分析，晶体缺陷和矿物高分辨点阵象的透射电镜观测结果。
This paper has presented the results of TEM studies about the unit cell para-meters, micro-twinning structure, crystal defect and lattice fringe image of grandidierite discovered in China recently.
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