并用扫描电子显微镜(sem)、透射电子显微镜(TEM)和原子力显微镜(afm)对阳极氧化铝膜的形貌和结构进行了表征。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). Transmission electron microscopy (TEM) and atom force microscopy (AFM).
方法用电子显微镜及原子力显微镜对生殖支原体标准株及分离株进行形态学的初步观察。
Mothods The morphology of Mg standard strains and clinical isolates were observed under electron microscopy (EM) and atomic force microscopy (AFM).
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
用原子力显微镜、扫描电子显微镜研究了复合材料的微观结构，并测试了力学性能。
AFM and SEM were used to study the microstructure of composites, and the mechanical properties were tested.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
并采用扫描电子显微镜（SEM）及原子力显微镜（AFM）对AAO模板表面及内部结构进行了表征。
Scanning electron microscope (SEM) and atom force microscope (AFM) were used to characterize the morphologies of the AAO template, respectively.
他们均附有表面的地形和截面图像原子力显微镜和高分辨率的透射电子显微镜，分别。
They were supplemented with surface topography and cross section images by atomic force microscopy and high-resolution transmission electron microscopy, respectively.
他们均附有表面的地形和截面图像原子力显微镜和高分辨率的透射电子显微镜，分别。
They were supplemented with surface topography and cross section images by atomic force microscopy and high-resolution transmission electron microscopy, respectively.
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