单位面积晶体管的急剧增多，给NOC可靠性带来了挑战。

The sharp increase of transistors per unit area takes a challenge to the reliability of NOC.

youdao

单位面积晶体管的急剧增多，给NOC可靠性带来了挑战。

The sharp increase of transistors per unit area takes a challenge to the reliability of NOC.

youdao