利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。

This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.

youdao

利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。

This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.

youdao