本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
弱电流测量的各种应用包括电容器的漏电、弱电流半导体、光和离子束测量等。
Low current measurement applications include capacitor leakage, low current semiconductor, light, and ion beam measurements.
在有些应用中，例如监测电化电池和测量半导体的电阻系数，则可能必须进行高阻抗电压切换。
High impedance voltage switching may be necessary in applications such as monitoring electrochemical cells and measuring semiconductor resistivity.
已经设计出专门的探头来测量半导体晶圆片和半导体棒的电阻率。
Special probes have been designed for making resistivity measurements on semiconductor wafers and bars.
根据砷化镓半导体的光吸收特性，设计了一种新型的发电转子温度测量系统。
A new kind of generator rotor temperature measuring system is designed based on optical absorption behavior of GaAs semiconductor.
本文根据实际测量结果，一叙述了半导体衬底制片质量对外延生长的影响。
Based on actual measurement results, the influence of process quality of semiconductor substrate wafers on epitaxial growth is described.
为使半导体产品达到所要求的光学、电子和机械性能，必须实时地在沉积过程中直接测量薄膜应力。
In order to meet the requirements of optical, electronic and mechanical performance of semiconductor products, it is necessary to measure thin film stress during the deposition.
利用红外辐射测温原理，设计成半导体基片上激光焦斑温度不接触测量系统。
With IR temperature-measuring principle, a non-contact measuring system for measuring laser spot temperature on semiconductor substrate is designed.
就SDL7432功率型半导体激光器的线性测量进行了讨论。
The linear measurement of SDL7432 power semiconductor laser has been discussed in this paper.
提出了一种精确测量半导体激光器结温的方法。
An accurate method for measuring the chip temperature of semiconductor lasers is presented.
本文采用一种新的数字图像相关方法测量带有半导体电热膜的远红外陶瓷热胀系数。
A new digital image correlation method (DICM) measurement is utilized to investigate the thermal expansion coefficient of the far-infrared ceramic coated the semiconductor galvanothermy membrane.
介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。
The measurement results of complex dielectric constants of low loss and thin flake materials, conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.
对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。
The sensitivity for the semiconductor minority carrier lifetime measurement system was determined using microwave photoconductance decay.
电化学C-V（ECV）法是当前测量化合物半导体载流子浓度分布的非常重要的方法。
Electrochemical capacitance-voltage profiler(ECV)is the most convenient method to characterize the carrier concentration of compound semiconductor.
电压测量方法，电测试方法和装置，半导体器件制造方法和器件衬底制造方法。
Voltage metering method, electric test method and device, and method for mfg. semiconductor device and device substrate.
本文介绍用四探针技术测量半导体薄层电阻的新方案。
A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.
本文用半导体激光器测量了金属表面散射光在入射平面的角度分布。
The angular resolved scattering light from a optical metal surface was measured in the plane of incidence.
自混合型的半导体激光多普勒测速仅提供了一个简单、便利的测量血流速的方法。
It is thought that the velocimeter can offer a simple and compact method to measure the speed of blood flow.
本文提出了一种新的测量半导体材料中少数载流子寿命的方法。
A new method for measuring the life time of minority current carriers in semiconductors is described.
叙述了为测量半导体光电器件的光电流谱和光反射谱所构成的自动测量系统及其数据处理方法。
The automatic measurement system and the data processing method are discussed for microspot photocurrent spectrum and reflection spectrum of semiconductor optoelectronic devices.
一种新研制成功便携式以室温半导体激光器为基础的中红外气体敏感器用于测量空气中甲烷浓度。
A portable room temperature diode laser based on mid infrared gas sensor was developed for open path measurements of methane in ambient air.
介绍一种采用比值采样测量半导体温度电阻的测量方法。
A method is presented for measuring semiconductor resistor using ratio sampling techniques.
本文报导了用微波介质波导反射法无接触测量半导体电阻率的实验装置。
We have designed a contactless measurement apparatus by a microwave dielectric waveguide reflection method.
设计了一种半导体激光干涉测量仪，可以实时测量物体的微小振动。
A new laser diode interferometer for micro vibration measurement is proposed. The interferometer can measure micro vibrations of an object in real time.
运用半导体的PN结扩散电流与电压关系特性，精确地测量了玻尔兹曼常数。
Based on the relationship between the diffusion current and voltage of PN junction, the Boltzmann's constant is measured with high accuracy.
应用半导体激光自混频干涉技术，对轴运动时的偏心速度进行了测量。
A turn axle eccentric velocities is measured by applying self-mixing interference in a diode laser.
系统采用单模光纤的尾纤半导体激光器作光源的激光准直系统，并为测量提供稳定的基准线。
A single mode fiber (SMF) pigtailed laser diode alignment system provides a laser reference line with fine stability for measurement.
本文报道了应用变温光伏方法对半导体表面能级，表面态密度的非破坏性测量原理。
The measured undestructivly theory for the surface energy level and the surface state density of semiconductors fay the method of photovoltages at changed temperatures is reported.
本文报道了应用变温光伏方法对半导体表面能级，表面态密度的非破坏性测量原理。
The measured undestructivly theory for the surface energy level and the surface state density of semiconductors fay the method of photovoltages at changed temperatures is reported.
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