本文提出了一种新的测量半导体材料中少数载流子寿命的方法。
A new method for measuring the life time of minority current carriers in semiconductors is described.
本文从半导体陶瓷PT C热敏电阻器入手，讨论了该热敏材料的电阻温度特性，给出了PT C热敏电阻器的测量结果和应用范围。
Starting with ceramic PTC thermal sensitive resistor of semi-conductors, the temperature characteristics of the resistance of its thermal materials are discussed.
作者提出了采用霍尔极值因数来表征不同半导体材料的霍尔特性及测量载流子迁移率之比值的新方法。
We conclude that the extremum factor of the Hall coefficient is a good measure of the Hall characteristic, and it can be also used to determine the mobility ratio of carriers in semiconductors.
对每一个测量组分的选择性可通过测量电极材料的选择特别是通过加进半导体来改善。
Selectivity of response for individual components of the measured gases can be improved by using specific material for the measuring electrodes, in particular semiconductors.
另一些对于晶圆片级半导体的弱电流测量则通常与介电材料(氧化物或化合物)的质量有关。
Other typical low current measurements on wafer level semiconductors are related to the dielectric, either the oxide or compound quality.
另一些对于晶圆片级半导体的弱电流测量则通常与介电材料(氧化物或化合物)的质量有关。
Other typical low current measurements on wafer level semiconductors are related to the dielectric, either the oxide or compound quality.
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