该系统充分发挥了S3C44B0嵌入式微处理器高性能优势，经调试证明，能够可靠地实现对半导体分立器件的参数测试和分选的功能。
The semiconductor testing system makes full use of the high-powered ARM microprocessor S3C44B0. It is testified that the system can meet the requirement of function.
介绍了半导体器件与电路的总剂量辐射效应及其测试技术。
The measurements of total dose effects of electronic devices and circuits are presented in this paper.
平板显示器中有源元件的参数测试与其他各类半导体器件的IC器件测试相同。
Characterizing the active elements in flat panel displays is similar to IC device testing on other types of semiconductors.
通过第一及第二拾取器系统在该测试盘、该缓冲盘及该用户盘之间传送该半导体器件。
The semiconductor devices are transferred among the test tray, the buffer tray and the customer tray by first and second picker systems.
电压测量方法，电测试方法和装置，半导体器件制造方法和器件衬底制造方法。
Voltage metering method, electric test method and device, and method for mfg. semiconductor device and device substrate.
半导体光电化学已广泛用于化合物半导体的材料测试和器件工艺。
The photoelectrochemistry of semiconductors has been widely used for the investigation of compound semiconductor materials and for the improvement of device technologies.
研究和实现了采用面阵CCD器件的半导体材料应力测试仪。
An instrument based on area array CCD devices for measuring stresses in semiconductor materials is studied and realized.
制备的器件用半导体激光测试，用CCD和示波器接收观察光信号。
The device was measured with a semiconductor laser, and the optical signal received by CCD was displayed on an oscilloscope.
致力成为一家综合的半导体测试解决方案供应商，是Electroglas重要的战略目标之一，因此伊智也为器件封装提供后道测试机械手和测试台管理软件。
They now also offer a final test handler for packaged devices and test floor management software as part of their strategy to be a comprehensive semiconductor test solutions provider.
本实用新型涉及一种半导体测试器件，尤其是半导体测试探针。
The utility model relates to a semiconductor test device, in particular to a semiconductor test probe.
本实用新型涉及一种半导体测试器件，尤其是半导体测试探针。
The utility model relates to a semiconductor test device, in particular to a semiconductor test probe.
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