实验结果表明，利用偏振态相互垂直的光之间的模竞争效应可以有效地提高扫描显微镜的轴向分辨率。
The experimental results indicate that mode competitive effects of orthogonal polarized lights can effectively improve axial resolution of scan microscope.
实验结果表明，利用偏振态相互垂直的光之间的模竞争效应可以有效地提高扫描显微镜的轴向分辨率。
The experimental results indicate that mode competitive effects of orthogonal polarized lights can effectively improve axial resolution of scan microscope.
应用推荐