我们把红外线显微镜——一个分光镜——放在很少很少的一点颜料上。
We put an infrared microscope—a spectroscope—on tiny tiny bits of paint.
整个系统由显微镜、分光计、面阵CCD相机、载物台自动装置以及数据采集与控制模块等几部分组成。
The whole system was composed of a microscope, a spectrometer, an area CCD camera, an automatic stage and data acquisition and control subsystem.
采用高倍显微镜和分光光度计对铝粉的分散和定向排列效果进行了表征。
The dispersion and directional array effects of aluminum powders were characterized with high power microscope and spectrophotometer.
重组菌经培养，利用荧光显微镜检测重组酵母的荧光强度，然后通过荧光分光光度计检测分选酶与底物相互作用后产生游离的EGFP荧光强度进而确定分选酶的酶活。
After cultivation, recombinant cells were verified with fluorescence microscopy and sortase activity was detected by fluorescence spectrophotometer from variety of free EGFP's fluorescence intensity.
用GPC、分光光度仪和扫描电子显微镜等对合成的聚合物进行了表征。
The properties of the macromonomer and the functional polymer microspheres have been studied by GPC, spectrophotometer and SEM.
方法：采用荧光显微镜、电子显微镜、激光扫描共聚焦显微镜、流式细胞分光光度计和DNA凝胶电泳等方法和技术观察细胞凋亡。
Method: Using fluorescence microscopy, electron microscopy, laser scanning confocal microscopy, flow cytometry and DNA gel electrophoresis to demonstrate the presence of apoptosis.
用透射电子显微镜、扫描探针显微镜、紫外-可见分光光度计和热重分析仪表征了复合材料的物理性能，分析了其吸收蓝移及热稳定性提高的机理。
The physical properties are characterized by TEM, SPM, UV-Vis and TGA. The mechanism of absorption blue-shift effect and the improving of thermal stability of nanocomposite materials are analyzed.
利用X射线衍射仪、扫描电子显微镜和荧光分光光度计对样品的晶体结构和光学性质进行了分析。
The structural and optical characteristics were studied by X-ray diffraction, scanning electron microscopy and Photoluminescence spectrum.
介绍了分析所需配备的实验仪器，主要有60倍显微镜、红外分光光谱仪和紫外分光光谱仪。
The necessary instruments for analysis include microscope with 60 fold magnification, infrared spectrograph and ultraviolet spectrograph.
用扫描电子显微镜观察了样品的形貌结构，用分光光度计测量了样品的透射光谱和偏振光谱。
We observe the morphology image of the samples by scanning electron microscopy (SEM), and measure the transmission spectrum and the polarization spectrum of the samples by the spectrophotometer.
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
通过X射线粉末衍射仪、场发射扫描电子显微镜和荧光分光光度计分别表征样品的晶体结构、颗粒形貌和发光性能。
The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.
利用X射线衍射、扫描电子显微镜和分光光度计对制备的V2O5薄膜的结构、形貌和光学特性进行研究。
The microstructure, the morphology and optical properties of V2O5 thin films were studied by XRD, SEM and spectrophotometer.
利用X射线衍射、扫描电子显微镜和分光光度计对制备的V2O5薄膜的结构、形貌和光学特性进行研究。
The microstructure, the morphology and optical properties of V2O5 thin films were studied by XRD, SEM and spectrophotometer.
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