显式冗余无助于提高电路性能，反而增加功耗，降低电路的可测试性，使电路面积增大，应予消除。

Explicit redundancy can not improve the performance, but increases power consumption, enlarges circuit area and decreases its testability, so it should be removed.

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文中提出了显式冗余的队列循环优化算法，完全消除了此类冗余，从而有效地减少了生成电路的基片面积，提高了电路的可测试性。

This paper proposes a queue loop optimization algorithm to remove explicit redundancy completely which decreases the circuit area and improves the testability.

youdao

文中提出了显式冗余的队列循环优化算法，完全消除了此类冗余，从而有效地减少了生成电路的基片面积，提高了电路的可测试性。

This paper proposes a queue loop optimization algorithm to remove explicit redundancy completely which decreases the circuit area and improves the testability.

youdao