通过疲劳断口的电镜扫描试验，证明防爆膜的疲劳破坏是由存在于金属内部的微裂纹和杂质所引起。
The photographs of the sweep electron microscope show that fatigue damage are caused mainly by microcracks and impurities of metal.
采用微焦点CT对疲劳试样进行了扫描与重建，获得了密度场图像库，并提取了试样内部的三维裂纹形态。结果表明裂纹以体的形式存在。
The specimen was scanned and reconstructed by means of Micro-CT, images of density field were obtained, and the 3D crack morphology was extracted.
采用微焦点CT对疲劳试样进行了扫描与重建，获得了密度场图像库，并提取了试样内部的三维裂纹形态。结果表明裂纹以体的形式存在。
The specimen was scanned and reconstructed by means of Micro-CT, images of density field were obtained, and the 3D crack morphology was extracted.
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