用X光电子能谱(XPS)和傅里叶变换红外光谱(FTIR)技术分析了薄膜的化学成分。
X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FTIR) were used to study chemical composition.
用X光电子能谱(XPS)和傅里叶变换红外光谱(FTIR)技术分析了薄膜的化学成分。
X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FTIR) were used to study chemical composition.
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