介绍一个利用线结构光扫描获取目标3维信息的测量系统。
A 3d shape acquisition system using linear structured light scan is introduced.
针对线结构光扫描测头多项式拟合测量模型的系统误差问题，提出了一套用于该测头系统误差提取与补偿的方法。
For polynomial fitting measuring model of a linear structured light scanning probe, the extraction and compensation methods for systematic errors of the probe are presented.
本文提出的结构光面扫描三维测量系统是基于机器视觉光栅编码原理的结构光扫描双目视觉测量技术。
The structure light 3-d measurement system is based on the structure light scanning binocular vision measurement of machine vision diffraction grating code principle technology.
本文提出的结构光三维测量系统是一种光栅式结构光扫描双目视觉测量技术。
In this paper, a 3d object measurement system based on binocular grating structured light measurement techniques is presented.
描述了一个基于光切原理的多CCD脚型三维测量系统，介绍了系统的测量原理以及扫描控制系统的设计。
A 3d measuring system with multi-CCD based on light section principle is described. The measuring principle of the system and the design of the scanning control system are presented.
描述了一个基于光切原理的多CCD脚型三维测量系统，介绍了系统的测量原理以及扫描控制系统的设计。
A 3d measuring system with multi-CCD based on light section principle is described. The measuring principle of the system and the design of the scanning control system are presented.
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