• 结晶形成结构陷阱俘获载流子能力结晶度为20%时达到极值

    Crystallization by annealing made the depth of trap level deep too, but the ability to trap charge carriers showed a maximum at crystallinity of 20%.

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  • 这种计算机模拟方法不仅可以得到自由光电子衰减曲线可同时获得各种俘获中心载流子行为曲线。

    However, through computer simulation, it can obtain not only the decay curve of free photoelectrons, but also the behavior curve of carriers in all kinds of trapping centers.

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  • 优惠的中心的电子俘获通过光激发载流子霍尔迁移率测量显示出来

    Preferentialtrapping ofelectrons by iron centers was shown by Hall mobility measurements on optically-excited charge carriers.

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  • 优惠的中心的电子俘获通过光激发载流子霍尔迁移率测量显示出来

    Preferentialtrapping ofelectrons by iron centers was shown by Hall mobility measurements on optically-excited charge carriers.

    youdao

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