俄歇表面结构分析。
给出了俄歇表面结构分析的许多应用。
影响层的厚度为30—50埃，它是进行深度剖面分析时，决定元素俄歇信号强度的第一位重要因素；
The dominant factor for Auger signal during the interface analysis is the altered layer with a thickness of 30-50A rather than the electron mean free path X.
给出了利用JAMP - 10型俄歇电子谱仪进行定量分析(包括深度定量分析)的一些结果。
Some results of quantitative analysis, including depth quantitative analysis, on Model JAMP-10 Auger Electron Mieroprobc are given.
从铜-镍合金的俄歇谱分析可知，合金能带的刚性能带理论并不适合本研究系统。
The analysis of Auger spectra of Cu, Ni and Cu-Ni alloy also shows that the "Rigid Band Model" is not suitable for Cu-Ni system.
结合俄歇电子能谱和红外光谱分析膜的微观结构，对薄膜的电子注入特性进行了理论分析与讨论。
The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.
用俄歇电子谱(aes)分析了铀试样处理前后表层的成分变化。
The composition of surface layer of uranium and treated uranium have been analyzed respectively by Auger Electron Spectroscopy (AES).
对抗菌膜进行了扫描电镜、X 射线光电子谱和俄歇电子谱的研究与分析，发现抗菌膜中存在多种以银元素的化合物。
The chemical state of silver in the films was analyzed by X-ray photoelectron spectrum, and Auger electron spectrum was performed to determine the concentration of silver atoms in various films.
俄歇电子发射，表面灵敏性，俄歇电子谱的测量，定性和定量分析，深度剖析等。
The content of this article includes Auger electron emission, surface sensitivity, measurement of Auger electron spectrum, qualitative and quantitative analysis, depth profile etc.
讨论了用俄歇深度剖面分布作超晶格结构分析的特点及其局限性。
The characteristics of Auger depth profile as a method for superlattice structure analysis, as well as its limitations, are discussed.
用俄歇能谱aes分析了合金钝化膜的组成。
沿垂直膜面俄歇电子（AES）逐层分析证明，优化溅射工艺制备的薄膜化学成分分布均匀。
The results of AES analyses proved that the optimized composition is uniform along the cross-sections of the film.
本文介绍了用扫描电子显微镜和俄歇电子谱仪观察和分析雾化态和热等静压态高温合金粉末颗粒的表面。
An investigation of the surface of Ni-base superalloy powder particles in both as-atomized and as-HIP' ed conditions has been presented in the paper.
采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。
The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
采用新兴古典经济学的超边际分析法，引入交易效率，对赫克歇尔-俄林的生产要素禀赋理论进行新的分析，可以得出很多有价值的结论。
Many valuable conclusions can be reached by adopting inframarginal analysis, introducing transaction efficiency, and conducting new analysis of Heckscher-Ohlin factor endowment theorem.
还确定了典型工艺条件，并用俄歇电子能谱分析了硅化钛膜的组分。
The typical growth condition is also determined. The composition of titanium silicide films is analysed…
用俄歇能谱仪对注入层的成分进行了分析。
The composition of the implanted layer was analysed with Auger electron spectroscopy.
这一结论得到了俄歇电子能谱分析的佐证，因为在浸泡过的膜的外层发现有铬的存在。
This conclusion is supported by Auger electron spectroscopy data, which show a chromium uptake in the outer layers of the immersed films.
这一结论得到了俄歇电子能谱分析的佐证，因为在浸泡过的膜的外层发现有铬的存在。
This conclusion is supported by Auger electron spectroscopy data, which show a chromium uptake in the outer layers of the immersed films.
应用推荐