本文提供了一种使用双倍可变观测点进行时滞测试的方法,保证了只需要测试少量通路就能完成整个电路的时滞测试。
This paper presents an approach to delay testing with duplicating variable observation points, which provides a high path delay fault coverage by testing a small number of paths.
本文提供了一种使用双倍可变观测点进行时滞测试的方法,保证了只需要测试少量通路就能完成整个电路的时滞测试。
This paper presents an approach to delay testing with duplicating variable observation points, which provides a high path delay fault coverage by testing a small number of paths.
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