随着微波通讯的飞速发展，对低损耗微波介质陶瓷的要求也越来越高。
The rapid developments of microwave communication systems require dielectric materials with high performances.
依据被测介质性质，在现有实验设备条件下，提出了一种标量法测量低损耗薄膜介质介电常数的新方法。
A new scalar method of measurement for low loss film medium is presented based on electric properties of measured medium under the present condition of laboratory.
阵列天线辐射单元采用空气介质的微带贴片天线，辐射效率高；阵列天线的馈线网络采用低损耗的空气带状线形式，降低了馈线损耗。
The radiating element of array antenna is air dielectric microstrip patch antenna, which has high efficiency, and the feed network is low loss air strip, which can reduce the loss of the feed line.
结果对低损耗和高损耗介质的测量精度都较高，测量误差较小。
RESULTS The measuring accuracy of low loss and high loss dielectric materials was high, and measuring errors were low.
采用SEM、X射线衍射分别对复合介质的微观结构及其相组成进行了观察与分析，并获得了制备低损耗复合介质的最佳热压工艺制度。
The microstructure is observed by means of SEM and phase composition analyzed by XRD. On the basis of the investigation, an optimum heat press system is established.
采用SEM、X射线衍射分别对复合介质的微观结构及其相组成进行了观察与分析，并获得了制备低损耗复合介质的最佳热压工艺制度。
The microstructure is observed by means of SEM and phase composition analyzed by XRD. On the basis of the investigation, an optimum heat press system is established.
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